2025年4月18日（周五），上午11：45-14：45，云谷校区E10-304教室，将开展“物质科学公共实验平台专题讲座“之“Oxford EDS+AFM 原理以及应用分享会”。
专题一：EDS极限表征—Extreme
主讲人：苗亚洲 ，中山大学构造地质学博士。研究生期间主要通过使用EBSD测量变质矿物内外石英颗粒结晶学方向探究显微变形过程，结合野外宏观变形特征，揭示地质演化历史。随后加入牛津仪器纳米分析部，负责EDS、EBSD、OmniProbe和WDS技术推广及应用支持。
Miao Yazhou, Ph.D. in Structural Geology, Sun Yat-sen University. During his graduate studies, he mainly used EBSD to measure the crystallography of quartz particles inside and outside metamorphic minerals to explore the microdeformation process, and combined with the macroscopic deformation characteristics in the field, he revealed the geological evolution history. He then joined the Nanoanalysis Division at Oxford Instruments, where he was responsible for the promotion and application support of EDS, EBSD, OmniProbe and WDS technologies.
内容：SEM+EDS是进行材料形貌和成分表征最高效的系统，物质科学公共实验平台的SEM 上配备了牛津仪器公司的 Ultim Extreme无窗能谱仪探测器，具有独特的无窗设计，可在极低电压下对纳米级材料进行成分表征，是高分子，半导体，表面科学和生物样品成分分析的绝佳利器。本次专题会将结合无窗能谱仪技术原理以及应用分享。
Content: Scanning electron microscope (SEM) and energy dispersive analysis (EDS) are the most efficient system for characterizing material morphology and composition. The SEM on Instrumentation and Service Center for Physical Sciences(ISCPS) is equipped with Oxford Instruments Ultim Extreme windowless EDS detector, which has a unique windowless design and can characterize the composition of nanoscale materials at extremely low voltages. It is an excellent tool for polymer, semiconductor, surface science, and biological sample composition analysis. This special session will combine the principle and application sharing of windowless EDS technology.
专题二：探秘纳米世界 用“AFM”看见微观世界
主讲人：徐哲涵 ，毕业于瑞典皇家理工学院，所学专业为纳米技术。目前是牛津仪器客户支持工程师，专注于AFM领域，全面负责各型号的原子力显微镜的安装调试工作，同时为客户提供专业且系统的解决方案，以及高效的技术支持服务。
Xu Zhenhan, Graduated from KTH Royal Institute of Technology in Nanotechnology, he is Customer Support Engineer at Oxford Instruments, specializing in the AFM field, And fully responsible for the installation and commissioning of all models of atomic force microscopes. He provides customers with professional and systematic solutions as well as efficient technical support services.
内容：原子力显微镜（AFM）以其纳米级分辨率和多功能性，成为材料科学、生命科学、纳米技术、工业检测等领域重要表征工具，同时还能获取丰富的物理化学信息，推动微观世界的探索与应用。西湖大学配备了牛津仪器 Cypher 系列和 Jupiter XR原子力显微镜。本次专题会将重点关注Cypher Es使用技巧以及应用分享。
Content: Atomic force microscopy (AFM) with its nanometer-level resolution and versatility, has become an important characterization tool in fields such as materials science, life science, nanotechnology, and industrial inspection. It can also obtain abundant physical and chemical information, promoting exploration and application in the microscopic world. Westlake University is equipped with Oxford Instruments Cypher series and Jupiter XR atomic force microscopes. This special session will focus on the usage techniques and application sharing of CypherEs.
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