2025年1月7日（周二），下午16：00-17：30，云谷校区E10-310教室，将开展“物质科学公共实验平台专题讲座“之“三维原子探针及其应用领域介绍”，详情如下，欢迎大家参加。
主讲人：史飞，CAMECA 科研销售经理
主题：三维原子探针及其应用领域介绍
时间：2025/1/7 16:00-17:30
地点：云谷校区 学术环E10-310
报告摘要
三维原子探针，也称为原子探针断层分析术（APT），是一种具有原子级空间分辨率的测量和分析技术，能够同时给出材料内部结构的三维图像和化学成分。相较各种成分与结构分析工具，APT特别适合于研究纳米尺度的小结构（沉淀、团簇、GP区等）以及各种内界面（晶界、相界、多层膜结构中的层间界面等），例如研究元素在界面的偏聚行为，又比如沉淀相的尺寸、分布以及成份。最近20年的技术发展大大拓展了三维原子探针的应用范围 — 从金属到半导体、陶瓷、先进材料（纳米线、量子阱）、甚至生物材料。时至今日其独特的功能已经为越来越多的研发人员所认识，APT已经逐渐追上TEM、SIMS的脚步，成为材料分析的主流分析技术之一。本讲座涵盖三维原子探针技术原理及其应用。
Atomic Probe Tomography (APT) is a state-of-the-art material measurement and analytical technique with atomic level spatial resolution that can simultaneously provide three-dimensional images of the internal structure and chemical composition of materials. Compared to various compositional and structural analysis tools, APT is particularly suitable for studying nanoscale small structures (precipitation, clusters, GP regions, etc.) as well as various internal interfaces (grain boundaries, phase boundaries, interlayer interfaces in multilayer film structures, etc.), such as studying the segregation behavior of elements at interfaces, and the size, distribution, and composition of precipitation phases. The technological development in the past 20 years has greatly expanded the application scope of three-dimensional atomic probes, from metals to semiconductors, ceramics, advanced materials (nanowires, quantum wells), and even biomaterials. Today, its unique functions have been recognized by more and more researchers, and APT has gradually caught up with TEM and SIMS, becoming one of the mainstream analysis techniques for material analysis. This lecture covers the principles and applications of APT.
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