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【讲座预告】冷场发射扫描电子显微镜:扫描电镜原理、操作、应用

时间:2026-05-22 作者: 点击:

【 时 间 】:2026年5月26日(周二),上午11:40-13:00

【 地 点 】:云谷校区E10-205教室

【 主 题 】:冷场发射扫描电子显微镜:扫描电镜原理、操作、应用

【主讲人】:武素芳工程师

【主持人】:聂颖 博士

【讲座语言】:中文

【 简 介 】:冷场发射扫描电镜(日立SU8600和SU8230),融合先进电子光学与智能化检测技术,搭载高性能冷场发射电子枪,电子束亮度高、束流稳定,可实现超高分辨率观察,1kV低电压下仍可达0.7nm,无需喷金即可清晰观测非导电、易损伤样品,有效避免电子束荷电与损伤。智能化操作、稳定的真空系统与优异的低电压成像性能,操作便捷、运行稳定,既能满足高精度科研需求,也适配工业质检与失效分析。是材料科学、半导体、纳米技术、生物医学等领域的核心分析设备。

本次报告的主要内容:仪器原理、案例分享、实操演示等。

【报名方式】:讲座提供午餐,请于5月25日16:00前扫描下方二维码报名。

Dear Teachers and Students,

The Instrumentation and Service Center for Physical Sciences (ISCPS) will host a lunch seminar titled "Cold Field Emission Scanning Electron Microscope: Principles, Operation and Applications" on Tuesday, May 26, 2026. Teachers and students who are interested are warmly welcome to register and attend.

Date & Time: Tuesday, May 26, 2026, 11:40- 13:00

Venue: Classroom E10-205, Yungu Campus

Topic: Cold Field Emission Scanning Electron Microscope: Principles, Operation and Applications

Speaker: Sufang Wu, Service Engineer

Host: Dr. Ying Nie

Language:Chinese

Introduction:

Cold Field‑Emission Scanning Electron Microscope (Hitachi SU8600 and SU8230) integrates advanced electron optics and intelligent detection technologies. Equipped with a high‑performance cold field‑emission electron gun, it features high electron‑beam brightness and stable beam current, enabling ultra‑high‑resolution observation. It achieves a resolution of 0.7 nm even at a low accelerating voltage of 1 kV. Non‑conductive and beam‑sensitive samples can be clearly observed without gold sputtering, effectively avoiding charging effects and electron‑beam damage. Featuring intelligent operation, a stable vacuum system and excellent low‑voltage imaging performance, it is user‑friendly and reliable in operation. It meets high‑precision research requirements as well as industrial quality inspection and failure analysis needs, serving as a core analytical instrument in materials science, semiconductors, nanotechnology, biomedicine and other fields.

Contents of this presentation: Instrument principles, case sharing, practical operation demonstrations, etc.

Registration: Lunch provided. Please scan the QR code below to register.

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下一条:【讲座预告】先进电子显微镜前沿技术研讨会

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